Device for measuring the thickness of a layer or coating on a fe

Details Device for measuring the thickness of a layer or coating on a fe Device for measuring the thickness of a layer or coating on a fe

1992-12-09

1995-11-14

O'Shea, Sandra L.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324227, G01B 706, G01R 3312

Patent

active

054670144

ABSTRACT:
A device for measuring the thickness of a layer of coating on a metal surface is disclosed. The device includes a housing, a first magnetic probe mounted on the housing for measuring the thickness of the layer on a metal substrate containing iron, and a second eddy current probe mounted on the housing for measuring the thickness of the layer on a metal substrate which does not contain iron. The first and second probes are physically separated from each other on the housing. A calculating circuit receives the output of one of the first and second probes and calculates the thickness of the layer as a function of the output of the one of the first and second probes. A display is coupled to the calculating circuit for displaying the thickness of the layer being measured.

REFERENCES:
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patent: 4403188 (1983-09-01), Nix
patent: 4539847 (1985-09-01), Paap
patent: 4599562 (1986-07-01), Koch
patent: 4715007 (1987-12-01), Fujita et al.
patent: 4733178 (1988-03-01), Koch
patent: 4745809 (1988-05-01), Collins et al.
patent: 4904939 (1990-02-01), Mian
patent: 5191286 (1993-03-01), Fischer
patent: 5241280 (1993-08-01), Aidun et al.
patent: 5343146 (1994-08-01), Koch et al.
"Schichtdickenmessung mit Magnetischen und Wirbelstrom-verfahren", Schubert, Werkstatt und Betrieb, vol. 112, No. 2, (Feb. 1979), pp. 123-127.
Multi-Check Brochure for coating thickness meter (prior art), List-Magnetik, Germany (date not available).
Positector Brochure, Automation Kohn, Company (Date not available).

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