Geometrical instruments – Gauge – Continuous gauging
Reexamination Certificate
1998-11-19
2001-03-13
Gutierrez, Diego (Department: 2859)
Geometrical instruments
Gauge
Continuous gauging
C033S526000, C019S0650CR, C019S239000
Reexamination Certificate
active
06199289
ABSTRACT:
FIELD OF THE INVENTION
The invention relates to a device for measuring the thickness and/or non-uniformity of waddings or non-wovens, described hereinafter as “laps”, with a guide for the lap, with a thickness-sensing element which presses the said lap against the said guide and is movable relative to the latter and the position of which represents a measure of the thickness and/or non-uniformity of the lap, and with a path measuring system.
BACKGROUND OF THE INVENTION
A device of this kind is already known from EP-A-0467117. In the said device, the thickness-sensing element is formed by a plurality of individual sensing elements disposed side by side, which can be individually shifted by the lap and extend over the breadth of the latter. Disposed in each individual sensing element is an electrical measuring device for detecting the position of the individual sensing element in relation to the guide. Signals for the position of each individual sensing element are thereby available which make it possible to identify differences which exist in the thickness of the lap, viewed over the breadth of the latter.
SUMMARY OF THE INVENTION
A disadvantage of this known device consists in the fact that the disposition of an electrical measuring device in each individual sensing element is extravagant and costly. If the measuring device operates with expansion-measuring strips, each individual measuring device has to be careful calibrated before starting, and this is an expensive process.
It is therefore an object of the present invention, such as is characterized in the patent claims, to provide a device of this kind which is simpler and cheaper, without it being necessary to accept losses in the quality of the measurements.
This is achieved through the fact that a thickness-sensing element is provided with a transmission element which transmits the movement of the thickness-sensing element to the path-measuring system in a direction which does not coincide with the direction of movement of the thickness sensing element. As a result of this, it is possible to provide a path-measuring system operating in a direction which can be selected at will.
Apart from the simpler construction of a device of this kind, there is the further advantage that the deflections of all the individual sensing elements are added at the same time, so that a signal is produced which represents the average thickness of the lap. This signal thus no longer needs to be ascertained by electrical processing of individual signals. The device can be designed in a simple manner for one, two or more individual sensing elements or even extended at a subsequent time to a number of individual sensing elements. In addition, it is possible to provide a path-measuring system operating in a direction which can be selected at will. When the device according to the invention is employed in a carder with an open regulating circuit, it is possible to supply the latter direct with a value for the thickness of the lap which is averaged over the breadth, a fact which permits more accurate regulation and leads to improved uniformity of the band at the outlet of the carder.
REFERENCES:
patent: 477818 (1892-06-01), Paterson
patent: 3916662 (1975-11-01), Arnold
patent: 4777729 (1988-10-01), Hausler
patent: 4881415 (1989-11-01), Hergeth
patent: 4903750 (1990-02-01), Ives
patent: 38 34 110 (1990-04-01), None
patent: 0 455 014 (1991-11-01), None
patent: 0 467 117 (1992-01-01), None
patent: 0 679 862 (1995-11-01), None
patent: 158509 (1983-09-01), None
patent: 4-034024 (1992-02-01), None
patent: 148263 (1962-01-01), None
patent: 202527 (1967-09-01), None
Burns Doane Swecker & Mathis L.L.P.
Fernandez Maria
Gutierrez Diego
Zellweger Luwa AG
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