Device for measuring plasma properties

Details Device for measuring plasma properties Device for measuring plasma properties

1985-12-30

1987-11-17

Yasich, Daniel M.

Thermal measuring and testing

Temperature measurement

Nonelectrical, nonmagnetic, or nonmechanical temperature...

356 43, 356 73, G01J 558, G01N 2121

Patent

active

047071478

ABSTRACT:
A device for measuring properties of plasma projects linearly polarized light to an object plasma as incident light, and the light coming from the plasma in response to the incident light is separated into an S-polarized component and a P-polarized component, so that temperature and other properties of the plasma are determined from such S- and P-polarized components.

REFERENCES:
patent: 3317737 (1967-05-01), Kopsel et al.
patent: 3462224 (1969-08-01), Woods et al.
patent: 3734620 (1973-05-01), Cade
patent: 3817622 (1974-06-01), Billman et al.
patent: 4020695 (1977-05-01), Roney
patent: 4140393 (1979-02-01), Cetas
patent: 4498765 (1985-02-01), Herve
"Spectroscopic Gas Temperature Measurement" by Richard H. Tourin, Elsevier Publishing Company, 1966, pp. 24-40.
"The Direct Measurement of Electron Density in an MHD Duct" by J. D. E. Beynon et al., Warsaw Symposium, Jul. 24-30, 1968, pp. 28-31 (vol. I).

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