Device for measuring mechanical states of stress in components

Details Device for measuring mechanical states of stress in components Device for measuring mechanical states of stress in components

1994-08-22

1995-03-28

Raevis, Robert

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

Specified electrical sensor or system

73862336, 324209, G01B 702

Patent

active

054006562

ABSTRACT:
A device for measuring mechanical states of stress in components has a part of the device positively joined to the component whose mechanical states of stress are to be measured. The part of the device undergoes a change in a measurable variable in the event of a change in the mechanical states of stress. The part of the device is a layer which is deposited on the component and which has a layer structure containing less than 8% by weight of phosphorous, preferably up to 3% by weight of phosphorous, up to 2% by weight of an element of main group IV or V, in particular antimony, and up to 5% by weight of a transition metal element, in particular cobalt. The weight percentages resulting from the sum are increased up to 100% with nickel. The layer modifies the magnetic flux in a coil arrangement comprising at least one coil, and the change in the magnetic flux in the coil arrangement is evaluated and the mechanical state of stress of the component are deduced from the change in the magnetic flux.

REFERENCES:
patent: 4646576 (1987-03-01), Kita
patent: 4991447 (1991-02-01), Yahagi et al.
patent: 5036713 (1991-08-01), Ikeda et al.
patent: 5146790 (1992-09-01), Fish
patent: 5165286 (1992-11-01), Hamamura et al.
Meyers Lexikon der Technik und der exakten Naturwissenschaften, Johannes Kunsemuller, pp. 547-549.

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