Device for measuring light incident on an optical system

Details Device for measuring light incident on an optical system Device for measuring light incident on an optical system

1981-07-16

1985-10-01

Arnold, Bruce Y.

Optics: measuring and testing

Photometers

Photoelectric

354429, 35016217, 350169, G01J 142, G02B 518

Patent

active

045442690

ABSTRACT:
A device for measuring light incident on an optical system comprises an optical system defining an optical path, a plurality of diffraction lattices arranged in the optical path, each of the diffraction lattices comprising a plurality of periodically arranged semireflecting oblique surfaces, and photodetector means for detecting each of the diffracted lights from the diffraction lattices distinctively. The diffraction lattices are each of different predetermined areas; however, when even light is input, each lattice diffracts the same total quantity of light to its respective detector.

REFERENCES:
patent: 4103153 (1975-07-01), Matsumoto et al.
patent: 4178084 (1979-12-01), Matsumoto et al.

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