Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1994-03-17
1996-04-16
Will, Thomas B.
Geometrical instruments
Gauge
Movable contact probe, per se
33558, 33DIG13, G01B 5016
Patent
active
055070990
ABSTRACT:
An arrangement for measuring distortion in cylinders. A sensor projects straight out of the end of a motion-transmitting arm. The arm can be both translated and rotated. The sensor accommodates a probe that probes the geometry of the surface of the cylinder. The sensor has a distortion-measuring structure accommodated in the head of a surface-geometry probe and a check for axially secured and undeflected tensioning of the probe. The probe is an elongated geometry-probing pin. The structure is securely tensioned remote from the chuck in the vicinity of a structure-attachment section in the head. The structure includes at least one zone of attenuation between the chuck and the structure-attachment section and has a resilient section and a strain gauge.
REFERENCES:
patent: 3945124 (1976-03-01), Jacoby et al.
patent: 4621434 (1986-11-01), Hirschmann
patent: 4879916 (1989-11-01), Juillerat
patent: 5012591 (1991-05-01), Asakawa
Overlach Knud
Wamser Manfred
Fogiel Max
Pietzsch Automatisierungstechnik GmbH
Will Thomas B.
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