Device for measuring a quantity which influences a field-effect

Details Device for measuring a quantity which influences a field-effect Device for measuring a quantity which influences a field-effect

1979-10-22

1981-05-12

Krawczewicz, Stanley T.

Electricity: measuring and testing

Conductor identification or location

Inaccessible

324425, 324459, G01R 2702

Patent

active

042675049

ABSTRACT:
A device for measuring a quantity which influences a field-effect transistor which is included in a measuring circuit as a variable resistance. To compensate for temperature-dependent changes of the field-effect transistor, an auxiliary signal, having a frequency located outside the frequency range of the quantity to be measured, is applied to the transistor. The two signals are separated from one another again after having been processed by the measuring circuit.

REFERENCES:
patent: 3328685 (1967-06-01), Hewlett
patent: 3490039 (1970-01-01), Tsao
Stetzler, Apparatus for Measuring Small Value Resistance, Western Electric Technical Digest, No. 44, Oct. 1976, pp. 51 and 52.

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