Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1989-10-27
1990-10-02
Raevis, Robert
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
G01B 716
Patent
active
049600001
ABSTRACT:
The invention concerns a device for measuring a physical quantity, for example a force (A), and providing an output signal (Vs) whose amplitude represents the measured value. The device comprises a first oscillator (1) including a resonator (3) to which the force (A) is applied, this oscillator delivering a first alternating signal (S1) whose frequency depends on the magnitude of the force (A), a second oscillator (2) supplying a second alternating signal (S2) whose frequency is determined by the amplitude of the output signal (Vs), an EXCLUSIVE OR gate (20) receiving the first and second signals, and a low-pass filter (21) delivering the output signal (Vs) in response to a signal supplied by the gate (20). The amplitude of this output signal depends on the phase difference of the first and second signals, and constitutes a measurement of the magnitude of the applied force (A). The device is advantageously used when the measurement is to be displayed in analog form.
REFERENCES:
patent: 4213337 (1980-07-01), Langdon
patent: 4346363 (1982-08-01), Wilhelmson
patent: 4398115 (1983-08-01), Gagnepain et al.
patent: 4498344 (1985-02-01), Dinger
patent: 4558248 (1985-12-01), Valentin
patent: 4594898 (1986-06-01), Kirman et al.
patent: 4741213 (1980-05-01), Hojoh
Asulab S.A.
Raevis Robert
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