Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1982-02-12
1984-05-22
Sikes, William L.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01B 902
Patent
active
044498233
ABSTRACT:
A method and apparatus for measuring the spectral width of a nearly monochromatic source of radiant energy, when the general shape of the spectral line is known. Portions of the signal beam from the source of energy are introduced into two parallel interferometers. In each interferometer, each beam is further divided into parts, one part being delayed with respect to the other part, and the parts then being recombined. The delays or optical path difference are chosen such that each output is a relative extremum. The optical path differences are also chosen such that the two inteferometers have different path differences. The ratio of transmissions of the signal by the two interferometers using the proper optical delays is an indication of the spectral width of the source if the spectral distribution is assumed or approximated.
REFERENCES:
Goldsmith et al., "Precision Interferometer Calibration Technique . . . " plied Optics, vol. 18, No. 12, pp. 1983-1987, Jun. 1979.
Schwiesow et al., "Temperature Profiling by Rayleigh-Scattering Lidar," Applied Optics, vol. 20, No. 11, pp. 1972-1979, Jun. 1981.
Englert Alvin J.
Koren Matthew W.
Pawlikowski Eugene J.
Sikes William L.
The United States of America as represented by the Secretary of
LandOfFree
Device for measurement of the spectral width of nearly monochrom does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device for measurement of the spectral width of nearly monochrom, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for measurement of the spectral width of nearly monochrom will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1475600