Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-07-03
2007-07-03
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
11028728
ABSTRACT:
According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) (1), through which signals (4, 5, 6) that are to be measured or analyzed are selectively fed, e.g. by means of a multiplex circuit (7,8), and wherein the signals may be connected by means of routes located internally in the component from switch points that are not directly accessible, e.g. points inside the chip (15to20) or covered contact points. The device according to the invention is particularly useful for highly integrated semiconductor chips.
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“IEEE Standard Test Access Port and Boundary-Scan Architecture” 1149.1-1990 ISBN 1-55937-350-4, published 1993.
Dörrhöfer Carsten
Schmid Wilhelm
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Patel Paresh
Stemer Werner H.
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