Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1986-04-02
1988-03-29
Willis, Davis L.
Optics: measuring and testing
Material strain analysis
By light interference detector
356347, 356354, G01B 9025
Patent
active
047339640
ABSTRACT:
A device for joining light waves by interferometric focusing optics and a small reflector with a cylindrical or spherical surface, which is positioned in the aperture of the object imaging optics so that the reference wave is reflected towards the picture detector and covers this. An auxiliary device comprising one or more reflecting surfaces may be positioned in the path of the beam behind the reflector so that the reference wave can be coarsely adjusted toward the reflector. In the extension of the path of the reference wave from the mirror via the lens to the reflector, a viewing screen may be positioned such that one by means of the naked eye can do coarse adjustment of the reference wave which focuses on the reflector.
REFERENCES:
Applied Optics, vol. 17, No. 4, 2/15/78, "Interferometric Testing with Computer-Generated Holograms", pp. 558-565.
Applied Physics Letters, vol. 14, No. 11, 6/1/69, "Submicrosecond Holographic Cine-Interferometry of Transmission", F. C. Jahoda.
Optics Communications, vol. 12, No. 4, 12/1974, pp. 421-426, "Holographic Vibration Measurement . . . with Target Vidicon".
NDT International, vol. 15, No. 3, 6/82, "An Instrument for Vibration Mode Analysis Using Electronic Speckle Pattern Inferferometry".
Conspectum A/S
Koren Matthew W.
Willis Davis L.
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