Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2007-10-30
2007-10-30
Johns, Andrew W. (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C348S092000, C356S239100, C356S239200, C356S239300, C356S239400, C356S239500, C356S239600, C356S239700, C356S239800, C356S391000
Reexamination Certificate
active
10189445
ABSTRACT:
The invention provides a device to inspect an illumination optical device and a method to inspect an illumination optical device that make it possible to efficiently inspect illumination optical devices and to control manufacturing cost. A lens array inspecting device is provided with a light source device to emit a parallel luminous flux, lens array holders to retain lens arrays, which are test objects that split the parallel luminous flux into a plurality of partial luminous fluxes, and a ground glass on which the optical images of the luminous fluxes emitted through the lens arrays are projected. On the ground glass, a parting frame appropriate to a design illumination region is formed. Therefore, whether the lens arrays are defective or non-defective can be determined by checking whether the optical images projected onto the ground glass include the area of the parting frame.
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