Device for generating internal voltages in burn-in test mode

Details Device for generating internal voltages in burn-in test mode Device for generating internal voltages in burn-in test mode

2007-11-20

2007-11-20

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C365S189110, C365S185230

Reexamination Certificate

active

10828082

ABSTRACT:
The disclosure is a device for applying a test voltage from the external of a memory device in a burn-in test mode. An internal voltage generator for a burn-in test is comprised of pad means receiving an external voltage, switching means turned on in the burn-in test mode, and an internal voltage generating means. An external voltage applied to the pad means during the burn-in test mode is transferred to the internal voltage generating means by way of the switching means.

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