Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1999-06-02
2000-08-01
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
3562391, 209580, 209587, G01B 1104, B07C 5342
Patent
active
060974931
ABSTRACT:
A granular object evaluation device for evaluating quality and shapes of transparent or translucent granular objects includes an illuminating device for irradiating light to the object fed into a measuring area by a feeder, a detecting device in which a detection viewing line is directed to the measuring area through a center portion of the illuminating device and which receives reflection light from the object, a light shielding plate located between the illuminating device and the detecting device, for preventing the light from the illuminating device from directly incident on the detecting device, and having an opening through which the detection viewing line passes, and a control device for analyzing detected signals from the detecting device and evaluating quality and shapes of the granular object. The device further includes a shielding mask for shielding light from a predetermined area such that no irradiation is made directly on the granular object from the predetermined area of the illuminating device with the detection viewing line as the center. Evaluation of quality of the granular object can be effected without being influenced by the reflection light which affects in the evaluation of the quality as an obstacle.
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Mitoma Yasuharu
Satake Satoru
Pham Hoa Q.
Satake Corporation
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