Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1993-12-08
1995-01-24
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324632, 324703, 324603, G01R 2726
Patent
active
053845420
ABSTRACT:
Device for estimating, at high temperature, the electromagnetic properties of a material, including:
an oven (1, 19, 20);
a waveguide (3) disposed at least in part in said oven, a housing for a specimen piece of uniform thickness made of said material, this specimen piece being such that, when it is disposed in said housing, its outer periphery matches the inner surface of the waveguide;
means (4, 5, 6) for applying an incident very high frequency electromagnetic wave to the waveguide (3); and
means (4, 5, 6) for collecting the electromagnetic wave reflected by said specimen piece.
A vertically disposed waveguide has (3) said housing provided at the open lower end (3B ).
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patent: 5119034 (1992-06-01), Ishikawa
AFSAR: "The Measurement of the Properties of Materials"-PiEEE -Jan. 1986, pp. 183-199.
Kwok: "Time-Domain Measurements for Determination of Dielectric Properties of Agricultural Materials"-IEEE Trans. on Intr. & Mecs. -Jun. 1979.
Maze et al., Microwave Journal, vol. 33, No. 10, Oct. 1990, pp. 77-88.
Buckmaster et al., IEEE Instrumentation and Measurement Technology Conference, Feb. 13-15, 1990, San Jose, Calif., pp. 115-118.
Bratieres Jean-Yves
Grenot Michel
Lahitte Pierre V. A.
Prache Brigitte
Societe Anonyme dite: Aerospatiale Societe Nationale Industriell
Solis Jose M.
Wieder Kenneth A.
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