Thermal measuring and testing – Thermal calibration system
Patent
1986-12-29
1989-04-04
Cuchlinski, Jr., William A.
Thermal measuring and testing
Thermal calibration system
219209, 219385, 219521, G01K 1500
Patent
active
048192490
ABSTRACT:
A test device for a thermally-activated instrument so that the accuracy of the instrument can be determined. In a first form of the invention, a cylindrical enclosure is provided for retaining the instrument and is connected to a power supply via terminals attached to the enclosure. The enclosure is slotted along its length to permit enlargement of the enclosure when necessary. A second enclosure, also slotted along its length and with a temperature sensing thermocouple attached thereto, is provided for retaining the thermally-activated instrument and is shaped to fit within the first enclosure. In a second form, a series of clustered enclosures are provided, with the enclosures being of varying sizes to accommodate thermally-activated instruments of various sizes. In a third form, enclosures are grouped into at least two separate groups, with the groups being capable of being electrically interconnected. In a fourth form, a conductive target is connected for heating within an enclosure, the target being mounted in registration with an opening in the enclosure so that the target can be aligned with an instrument situated some distance from the enclosure.
REFERENCES:
patent: 2854844 (1958-10-01), Howell
patent: 3738174 (1973-06-01), Waldron
patent: 4075882 (1978-02-01), Waldron
patent: 4198849 (1980-04-01), Siess et al.
patent: 4529869 (1985-07-01), Ekstrom, Jr.
patent: 4643586 (1987-02-01), Hansen
Ekstrom Allan D.
Ekstrom Regner A.
Ekstrom Ronald E.
Ekstrom Walter E.
Cuchlinski Jr. William A.
Worth W. Morris
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