Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-11-21
1988-11-15
Wan, Gene
Optics: measuring and testing
By polarized light examination
With light attenuation
350380, G01B 1128
Patent
active
047844922
ABSTRACT:
A series of equidistant measuring heads is arranged at a uniform distance above a surface to be measured. Each head includes a light source emitting light through a narrow exit opening, and two light sensors arranged adjacent the opposite narrow sides of each opening. The light input characteristic of respective sensors is such that light reflected from the measured surface section is detected with a sensitivity which is inversely proportional to the different intensity of illumination of central and marginal points of the measured section.
REFERENCES:
patent: 3621268 (1971-11-01), Friedrich et al.
patent: 4213708 (1980-07-01), Lucas
Dietrich Gudrun
Morgenstern Bernd
Weigend Helmut
Striker Michael J.
VEB Kombinat Polygraph "Werner Lamberz Leipzig"
Wan Gene
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