Device for detecting the position of crystallization interface

Details Device for detecting the position of crystallization interface Device for detecting the position of crystallization interface

1988-04-25

1990-04-17

Groody, James J.

Facsimile and static presentation processing

Static presentation processing

Attribute control

358107, 358101, 156601, H04N 718

Patent

active

049185209

ABSTRACT:
A device for use in a monocrystal producing apparatus based on the FZ method and designed to detect a crystallization interface (20) between a melt (16) and a monocrystalline rod (12) even if the luminous line of the crystallization interface is partly curved downward. This device samples a series of luminance signals from the side of the melt to the side of the monocrystalline rod along a sensing line intersecting the crystallization interface, thereby successively outputs a series of sampled luminance signals (Sj), determines a value as a reference level (S.sub.0) relative to this specific level of the luminance signals, e.g., a peak value thereof, and discriminates the crystallization interface when one of the series of sampled luminance signals exceeds the reference level. A pixel position corresponding to this discrimination is determined as a pixel position corresponding to the crystallization interface.

REFERENCES:
patent: 3617631 (1971-11-01), Soames
patent: 3835247 (1974-09-01), Soames
patent: 4242589 (1980-12-01), Sachs
patent: 4277441 (1981-07-01), Sachs
patent: 4565598 (1986-01-01), Seymour
Patent Abtracts of Japan, vol. 8, No. 211, p. 303 [1648], Sep. 1984; & JP-A-59 94 006, Hitachi Seisakusho K.K., May 30, 1984.
Computer Design, vol. 21, No. 8, Aug. 1982, p. 24, Winchester, Mass., J. Aseo; "Machine vision system inspects 100% of manufactured parts".

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