Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1991-05-15
1993-11-23
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
73 1B, 427 10, G01R 2702
Patent
active
052647978
ABSTRACT:
A device for detecting contaminants on a surface of a conductive test sample includes first and second probes for engaging contaminants on a test sample surface. The first and second probes are connectable to a device for measuring voltage drop and are dimensioned and configured for measuring voltage drop across contaminants on the test sample surface at a predetermined contact force. The predetermined contact force is selected to prevent the first and second probes from piercing the contaminants. The device also includes a device for biasing the probes against the contaminants on the test sample surface with the predetermined contact force. The device for biasing the probes against the contaminants on the test sample surface include a moveable probe arm and a counterweight on the moveable probe arm which permits the predetermined contact force between the first and second probes to be selected. The moveable probe arm is adapted for both horizontal and vertical movement. Current leads connected to the probes are connectable to a source of electrical potential. Voltage leads connected to the probes are connectable to means for measuring and indicating the voltage drop between the voltage leads. The presence of contaminants on the test sample surface may be detected by engaging the first and second probes against the contaminants on the test sample sample surface with the predetermined contact force, applying an electric current to two current leads, and measuring a voltage drop across two voltage leads.
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Dahlstrom Jonathan
Meduvsky Alex G.
Harvey Jack B.
Regan Maura K.
Romanik George J.
United Technologies Corporation
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