Device for detecting a cracked substrate

Details Device for detecting a cracked substrate Device for detecting a cracked substrate

2006-06-28

2008-09-16

Lefkowitz, Edward (Department: 2855)

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

C073S804000, C073S808000, C356S237300, C356S237400, C356S237500

Reexamination Certificate

active

07424828

ABSTRACT:
A substrate detection system is disclosed to include a conveyer that delivers the substrates, a sensor that detects the length of each substrate being delivered by the conveyer over the top side of the sensor, and a processor that compares the detection length value of each substrate detected by the sensor with a predetermined length value stored therein so as to immediately stops the conveyer when the detection length value of one substrate is unequal to the predetermined length value. In an alternate form, the time value in which each substrate passed over the sensor is used as a parameter for judgment.

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