Device for controlling a semiconductor element

Details Device for controlling a semiconductor element Device for controlling a semiconductor element

2008-04-22

2008-04-22

Lam, Tuan T (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Current driver

C327S427000, C327S437000, C324S1540PB, C324S765010

Reexamination Certificate

active

07362148

ABSTRACT:
A control device for controlling a load drive semiconductor element for driving a load has a test operation mode for measuring a leak current of the load drive semiconductor element. In the test operation mode, a control terminal of the load drive semiconductor element is electrically separated from a power source or a ground by turning off another semiconductor element. Therefore, no electric current flows from the power source to the control terminal or from the control terminal to the ground. Therefore, the leak current of the load drive semiconductor element can be easily measured, even after the load drive semiconductor element is electrically connected to the control device for fabricating one-packaged IC.

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patent: 7046050 (2006-05-01), Schottler
patent: 7126802 (2006-10-01), Ishikawa et al.
patent: 7176744 (2007-02-01), Goudo
patent: 2001/0005152 (2001-06-01), Karaki et al.
patent: 2003/0197543 (2003-10-01), Imai

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