Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2005-03-08
2005-03-08
Larkin, Daniel S. (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C216S002000, C216S011000, C369S127000, C369S170000
Reexamination Certificate
active
06862925
ABSTRACT:
A device for contacting and/or modifying a surface having a cantilever connected to an almost plane carrier element staying apart from said surface, said cantilever having a tip at its loose end being in close contact to said surface. It is proposed that the cantilever stand out of the plane of said carrier element. Further, a method for producing the cantilever having a tip at its loose end. The device is suitable for thermomechanical writing and thermal readout of binary information, lithographic and imaging techniques, and for surface modification.
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patent: 5992225 (1999-11-01), Shirakawabe et al.
patent: 6405584 (2002-06-01), Bindell et al.
Despont, M. et al., “VLSI-NEMS Chip for AFM Data Storage”, Micro Electro Mechanical Systems, 1999 MEMS '99 IEEE International Conference, Jan. 17-21, 1999, pp. 564-569.
Desponet Michel
Drechsler Ute
Lutwyche Mark I.
Rothuizen Hugo E.
Vettiger Peter
Kotab Dominic M.
Larkin Daniel S.
Zilka-Kotab, PC
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