Device for contact-free thickness or interval measurement

Details Device for contact-free thickness or interval measurement Device for contact-free thickness or interval measurement

1980-01-18

1982-01-05

Buczinski, S. C.

Optics: measuring and testing

Range or remote distance finding

With photodetection

356 4, G01C 300, G01C 500, G01C 308

Patent

active

043091032

ABSTRACT:
A device is disclosed for contact-free thickness or interval measurement wherein a light source generates a light ray beam which is periodically deflected. A beam divider divides out a light ray beam for reception by first and second light-sensitive detectors which receive light only along a specific optical axis. At least one third light-sensitive detector is provided whose optical axis intersects the light ray beam at a reference plane. Electronic evaluation means are provided for generating from signals of the first, second, and third detectors a control voltage corresponding to a deflection time of the light ray beam and also at least one voltage impulse which is a measure of an interval of a surface of a measured object from the reference plane. A reference voltage is provided and means are provided for generating a corrected reference voltage by changing the reference voltage in a direction opposite to a deviation of the control voltage from a normal operating voltage. An impulse/digital converter receives the voltage impulse and provides a digital output which is connected to a digital/analog converter which creates an analog output based upon the corrected reference voltage and the digital input.

REFERENCES:
patent: 4053227 (1977-10-01), Bodlaj
Siemens Forschungs-und Entwicklungsbericht, vol. 4, 1975, No. 6, pp. 336-344.
Siemens Forschungs-und Entwicklungsbericht, vol. 6, 1977, No. 3, pp. 180-188.

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