Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-03-01
2005-03-01
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S765010
Reexamination Certificate
active
06861861
ABSTRACT:
A semiconductor device handler is provided, in which a test temperature deviation of a semiconductor device caused by heat produced by the semiconductor device itself during testing is compensated for, allowing a test of the semiconductor device to be carried out at an exact temperature, or within an exact temperature range. The semiconductor device handler includes at least one enclosed chamber, a heating/cooling apparatus configured to bring an inside of the at least one chamber to a low or high temperature state, a pushing unit provided within the at least one chamber and configured to push a plurality of semiconductor devices mounted on a test tray into test sockets of a test board located within the at least one chamber for testing, a cooling fluid supplying apparatus configured to supply cooling fluid, a nozzle assembly configured to spray cooling fluid received from the cooling fluid supplying apparatus onto the semiconductor devices fitted to the test sockets, and a control unit configured to control spraying of cooling fluid onto the semiconductor devices during testing to compensate for temperature changes of the semiconductor devices that occur during testing.
REFERENCES:
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patent: 3979671 (1976-09-01), Meeker et al.
patent: 4787752 (1988-11-01), Fraser et al.
patent: 5909657 (1999-06-01), Onishi et al.
patent: 6104183 (2000-08-01), Kobayashi et al.
patent: 6384593 (2002-05-01), Kobayashi et al.
Ham Chul Ho
Hwang Eui Sung
Lee Byeng Gi
Lee Eung Yong
Lim Woo Young
Fleshner & Film, LLP
LG Electronics Inc.
Nguyen Vinh P.
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