Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Patent
1998-02-20
2000-08-15
Hoff, Marc S.
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
702120, 714724, 714737, 714742, 714718, 324 731, G01R 3100
Patent
active
061049859
ABSTRACT:
An apparatus for classifying a device as being a first device type or a second device type, includes a fixture for coupling at least one device to be identified to the system; and a processor coupled to the fixture. The processor is programmed to test at least one predetermined terminal of the device and designate the type of the device based upon the results of the test
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U.S. Patent Application Serial No. 09/026,873, filed Feb. 20, 1998, entitled Method for Classifying Electronic Devices.
Hoff Marc S.
Micron Electronics Inc.
Vo Hien
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