Device for characterizing wide angle beams

Details Device for characterizing wide angle beams Device for characterizing wide angle beams

1986-01-10

1987-12-15

Rosenberger, R. A.

Optics: measuring and testing

Lamp beam direction or pattern

356360, G01J 100

Patent

active

047129140

ABSTRACT:
A system for characterizing miniature optical sources such as laser diodes is disclosed. In its most convenient form the system includes an optical system for collecting a wide angle beam and collimating the beam into substantially parallel rays. In the substantially parallel beam, equal area angular portions of the wide angle beam should correspond to equal areas in the parallel beam. Optical sensors are utilized to generate signals indicative of the intensity of the parallel optical beam. Digital processing is included to calculate the characteristics of the optical beam from the intensity samples of the parallel beam. In one embodiment, a reflecting plane is positioned between the source and the optical system so that Lloyd's fringes are produced in a measurement plane.

REFERENCES:
patent: 3746449 (1973-07-01), Schick
patent: 4584484 (1986-04-01), Hutchin
Knudtson et al., "Laser Beam Spatial Profile Analysis Using a Two-Dimensional Photodiode array", Rev. Sci Instrum, vol. 54, No. 7, (Jul. 1983), pp. 856-866.

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