Optics: measuring and testing – Standard
Patent
1975-08-18
1977-01-18
Corbin, John K.
Optics: measuring and testing
Standard
350159, 350320, 356114, G01V 104, G01V 400, G02B 530, G02B 2728
Patent
active
040036634
ABSTRACT:
A device for calibrating an instrument that measures circular dichroism has a transparent dielectric plate rotatably mounted in a framework so as to be rotatable about an axis passing through the plate substantially normal to the main irradiation direction, and means for indicating the angular position of the plate relative to its axis of rotation. A quarter-wavelength plate is mounted on the framework spaced from the dielectric plate with a surface normal to the irradiation direction.
REFERENCES:
patent: 3637311 (1972-01-01), Tipotsch
Hunter, et al., "The Effects of Polarizer Ellipticity on Ellipsometry Measurements," Surface Science vol, 20, 1970, pp. 355-376.
Corbin John K.
Punter Wm. H.
Sandler Donald M.
Yeda Research & Development Co. Ltd.
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