Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Using radiant energy
Patent
1992-12-04
1996-04-02
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Using radiant energy
324768, 324769, G01R 3126
Patent
active
055044310
ABSTRACT:
A luminescence amount detecting part detects a weak optical radiation which a transistor in a semiconductor integrated circuit emits owing to a hot carrier effect. An output thereof is image-processed by an image processing part. An information storage part stores information on a transistor width and information on a switching frequency at an execution of a test pattern into each transistor. A switching time calculating part evaluates a switching time of the transistor from respective outputs of the image processing part and the information storage part to output a result. Thus the switching time can be evaluated easily without a electron beam tester whose operation is complicated. A delay time can be evaluated by detecting a luminescence amount which changes depending on a gate voltage, instead of measuring a gate voltage.
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Maeda Toshinori
Uraoka Yukiharu
Karlsen Ernest F.
Matsushita Electric - Industrial Co., Ltd.
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