Device for analyzing failure in semiconductor device...

Details Device for analyzing failure in semiconductor device... Device for analyzing failure in semiconductor device...

2005-02-22

2005-02-22

Tokar, Michael (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C365S201000

Reexamination Certificate

active

06859061

ABSTRACT:
The variable power source applies to a wiring to which an internal voltage is being applied, a voltage equivalent to a reference voltage of the internal voltage from the outside of the semiconductor device. By this voltage application, the voltage being input to the voltage comparison circuit becomes equal to the reference voltage, so that a control signal causes the charge pump circuit to stop the operation. As the charge pump circuit is stopped, power supply voltage, power supply current and others of the semiconductor device become stable. Thus, even in the semiconductor device provided with an internal voltage generating circuit, a defective portion is detected precisely.

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patent: 6228666 (2001-05-01), Kawano
patent: 6472897 (2002-10-01), Shyr et al.
patent: 6490701 (2002-12-01), Roohparvar et al.
patent: 0585870 (1994-03-01), None
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patent: 9-145795 (1997-06-01), None
patent: 11-118887 (1999-04-01), None

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