Device design-for-test and burn-in-board with minimal...

Details Device design-for-test and burn-in-board with minimal... Device design-for-test and burn-in-board with minimal...

2007-08-14

2007-08-14

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S1540PB

Reexamination Certificate

active

11221472

ABSTRACT:
The invention includes a design for device design-for-test and a burn-in-board that reduce the number of external components per device on the board. Inputs to the I/Os of a device from input means are inverted between pairs of output pins. A single resister is coupled between an output that is true (e.g., not inverted) and an output that is inverted. Thus, instead of using one or more resistors per I/O from the DUT, a single resister can be coupled between inverted and non-inverted outputs.

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