Device and system for evaluating a lens for an electronic...

Details Device and system for evaluating a lens for an electronic... Device and system for evaluating a lens for an electronic...

2011-05-31

2011-05-31

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

Inspection of flaws or impurities

Transparent or translucent material

C356S239100, C356S237300, C250S559400, C250S559490, C349S113000, C349S187000

Reexamination Certificate

active

07952702

ABSTRACT:
The disclosure relates to a system and device for evaluating imperfections in a lens for a display for an electronic device. The evaluation device comprises: a substrate; and a pattern imposed on the substrate. The pattern comprises a series of lines in a grid imposed on the substrate wherein when the pattern is viewed through the lens, the series of lines having thickness of between approximately 10 and approximately 150 microns, spaced in intervals between approximately 20 microns and approximately 300 microns from center to center, the pattern is distorted around an area where a defect is present in the lens. With the device, the lens is identifiable as being defective if the pattern appears as a moiré distortion in the area when viewed through the lens.

REFERENCES:
patent: 4876121 (1989-10-01), Cohen
patent: 5764209 (1998-06-01), Hawthorne et al.
patent: 5812260 (1998-09-01), Louisnathan
patent: 5847822 (1998-12-01), Sugiura et al.
patent: 6191850 (2001-02-01), Chiang
patent: 6195164 (2001-02-01), Thompson et al.
patent: 6556286 (2003-04-01), La Fontaine et al.
patent: 7166856 (2007-01-01), Cho et al.
patent: 7586323 (2009-09-01), Kang et al.
patent: 2002/0071111 (2002-06-01), Epstein
patent: 2003/0700000 (2003-06-01), Weyer et al.
patent: 2006/0017676 (2006-01-01), Bowers et al.
patent: 2006/0110580 (2006-05-01), Aylward et al.
patent: 2007/0046321 (2007-03-01), Kang et al.
patent: 1 061 329 (2000-12-01), None

Affiliated with

Also associated with

Rating

Device and system for evaluating a lens for an electronic... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and system for evaluating a lens for an electronic..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and system for evaluating a lens for an electronic... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2627186