Device and process for measuring solid concentrations in liquids

Details Device and process for measuring solid concentrations in liquids Device and process for measuring solid concentrations in liquids

1994-02-01

1995-05-16

Rosenberger, Richard A.

Optics: measuring and testing

By particle light scattering

With photocell detection

356442, G01N 2151, G01N 2153

Patent

active

054165814

DESCRIPTION:

BRIEF SUMMARY
The present invention relates to a device and a process for measuring solid concentrations in liquids, wherein the light from two sources directed at the liquid is simultaneously measured in a combined 90.degree. scattered-light and backscatter process and processed, and from this the solid concentration is determined.


BACKGROUND AND SUMMARY OF THE INVENTION

In German Patent 3905101, a process and a device are described for measuring concentrations of suspended particles, the process being particularly suited for high particle concentrations. In this process light introduced into the suspension is scattered at the particles and measured at two locations at different distances. The particle concentration is determined from a combination of these measured values. This is done on the assumption that the introduced light is coupled into and out of the same window, which compensates for an eventual soiling of the window. The disadvantage of this is the fact that this assumption is only correct in specific situations, and that inaccurate measurements occur because of the window with nonhomogeneous soiling.
Processes for measuring low and minimal particle concentrations are known in water technology, where turbidity measurement is employed to assess the quality of drinking water, for example. Scattered-light processes are predominantly used for this. At low concentrations the term turbidity is generally used, whereas with high particle concentrations the terms predominantly used are solid content or solid concentrations. The term solid concentration (in g/l) will be used exclusively below, even with extremely low solid concentrations, where otherwise the term used would be turbidity values.
The object of the present invention is to disclose devices and processes with which solid concentrations, particularly low as well as high, can be determined with the same measuring process or the same measuring array via the 90.degree. scattered light and backscatter.
In accordance with the invention, this object is attained by means of devices and processes in accordance with the wording in claims 1 through 12. Shown are:


BRIEF DESCRIPTION OF THE DRAWING FIGURES

FIG. 1 a schematic representation of a 90.degree. scattered-light process;
FIG. 2 a schematic representation of a backscatter process having two detectors and two different light paths;
FIG. 3 a schematic representation of a multiple-beam process for 90.degree. scattered light measurement having two sources and two detectors;
FIG. 4 a schematic representation of a multiple-beam process in accordance with the invention for backscatter measurement having two sources and two detectors;
FIG. 5 a schematic representation of a combination in accordance with the invention of the multiple-beam processes for 90.degree. scattered light measurement and 120.degree. backscatter measurement having two sources and four detectors, seen from above;
FIG. 6 a schematic representation of a combination in accordance with the invention of the multiple-beam processes for 90.degree. scattered light measurement and 120.degree. backscatter measurement having two sources and four detectors, seen from the side;
FIG. 7 a schematic representation of an exemplary embodiment having 2 sources and 4 detectors, seen from the side;
FIG. 8 the prism of FIG. 7 in a top view;
FIG. 9A the prism of FIG. 7 in view A;
FIG. 9B the prism of FIG. 7 in view B;
FIG. 10 a schematic representation of a second exemplary embodiment having a cleaning element and two screens, seen from the side; and
FIG. 11 a schematic representation of a third exemplary embodiment for the arrangement of two sources and two detectors, seen from above.
The invention is described below in detail in conjunction with FIGS. 1 through 11.


DETAILED DESCRIPTION

FIG. 1 shows a schematic representation of a known arrangement for a 90.degree. scattered-light process.
Source Q1 transmits light through the window F onto the substance M to be measured, which contains particles P and is then encompassed by windows F1 and F2. The light from so

REFERENCES:
patent: 3146293 (1964-08-01), Lesage
patent: 3506360 (1970-04-01), Albert
patent: 3553462 (1971-01-01), Johnson
patent: 4914310 (1990-04-01), Jarofski
patent: 5012119 (1991-08-01), Rhiner
Patent Abstracts of Japan, vol. 12, No. 280 (P-739)(3127) Aug. 1988.
Patent Abstracts of Japan, vol. 6, No. 212 (P-151)(1090) Oct. 1982.

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