Device and procedure for measuring memory cell currents

Details Device and procedure for measuring memory cell currents Device and procedure for measuring memory cell currents

2008-05-27

2008-05-27

Elms, Richard T. (Department: 2824)

Static information storage and retrieval

Floating gate

Particular biasing

C365S198000, C365S201000

Reexamination Certificate

active

11274483

ABSTRACT:
The invention relates to a procedure and a device for measuring memory cell currents, in particular for non-volatile memory components, where the device has a current mirroring device for mirroring a current flowing through a memory cell when it is being read, and delivering an analog current signal generated during the mirroring, or an analog current signal derived from it, to an analog output pad of a memory component.

REFERENCES:
patent: 5889702 (1999-03-01), Gaultier et al.
patent: 5986937 (1999-11-01), Yero
patent: 6219277 (2001-04-01), Devin et al.
patent: 6229296 (2001-05-01), Duesman
patent: 6480421 (2002-11-01), Osama
patent: 6836443 (2004-12-01), Dadashev
patent: 10135775 (2004-02-01), None
patent: 10-0239729 (1998-11-01), None

Affiliated with

Also associated with

Rating

Device and procedure for measuring memory cell currents does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and procedure for measuring memory cell currents, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and procedure for measuring memory cell currents will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3944335