Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-12-04
2010-02-16
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07664611
ABSTRACT:
An apparatus and method for providing a reference voltage for regulating voltage levels. The apparatus includes a first voltage generation system for receiving a first control signal and output a calibration voltage, a voltage adjustment system for receiving the calibration voltage and a reference voltage and output a second control signal, and a second voltage generation system for receiving the second control signal and output the reference voltage. The voltage adjustment system includes a latch system for receiving a third control signal and a fourth control signal and output the first control signal.
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patent: 7162380 (2007-01-01), Luo
patent: 7353124 (2008-04-01), Luo
patent: 2003/0151450 (2003-08-01), Nguyen et al.
Bui Bryan
Moffat Jonathan Teixeira
Semiconductor Manufacturing International (Shanghai) Corporation
Townsend and Townsend / and Crew LLP
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