Device and method for testing integrated circuits

Details Device and method for testing integrated circuits Device and method for testing integrated circuits

2004-07-08

2008-07-15

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S189000

Reexamination Certificate

active

07400995

ABSTRACT:
A test device and method is disclosed. In one embodiment, the test device includes a precision signal generator for generating a test signal, which generator is connected via a respective connecting line to a respective input contact intended for connection to an input of an integrated circuit, and at least one reference signal generator for generating a reference signal. Furthermore, at least one comparator unit is provided for a respective input contact said comparator unit being able to be operated in a test mode. In the test mode, the test signal is compared with the reference signal. The precision signal generator is turned off by the comparator unit if the test signal exceeds or falls below the reference signal.

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