Device and method for testing integrated circuit including bi-di

Details Device and method for testing integrated circuit including bi-di Device and method for testing integrated circuit including bi-di

1997-11-24

1999-04-27

Nguyen, Hoa T.

Excavating

371 221, 371 225, G01R 3128

Patent

active

058987037

ABSTRACT:
The present invention includes a main circuit and a circuit to be tested. An observation node and a control node are connected to the circuit to be tested. A pin is connected via an analog switch and a digital switch to these nodes. The test circuit controls the switch and input and output of test data. The test circuit has one bi-directional digital pin. A control signal and observation data are input to and output from an analog circuit through an analog test pin.

REFERENCES:
patent: 4656632 (1987-04-01), Jackson
patent: 4687989 (1987-08-01), Davis et al.
patent: 5146161 (1992-09-01), Kiser
patent: 5404358 (1995-04-01), Russell
patent: 5513186 (1996-04-01), Levitt
patent: 5557236 (1996-09-01), Monti

Affiliated with

Also associated with

Rating

Device and method for testing integrated circuit including bi-di does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and method for testing integrated circuit including bi-di, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for testing integrated circuit including bi-di will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-690457