Device and method for testing electronic components

Details Device and method for testing electronic components Device and method for testing electronic components

2007-05-22

2007-05-22

Karlsen, Ernest (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C209S573000

Reexamination Certificate

active

11316342

ABSTRACT:
A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external contacts of the electronic components form an electrical connection to the testing contacts. Via the testing contacts, it is possible to apply input voltages and input currents to the electronic components and it is possible to measure the voltages, currents and resistances prevailing in the electronic components. The testers check the electronic components on the basis of a predetermined overall set of test criteria or on the basis of subsets of the overall set of test criteria.

REFERENCES:
patent: 4985673 (1991-01-01), Horie
patent: 5589765 (1996-12-01), Ohmart et al.
patent: 6043443 (2000-03-01), Doran et al.
patent: 6154712 (2000-11-01), Breu et al.
patent: 6731127 (2004-05-01), Watts
patent: 6975028 (2005-12-01), Wayburn et al.
patent: 2003/0005376 (2003-01-01), Lee et al.
patent: 2000193717 (1998-12-01), None
patent: 11039180 (1999-02-01), None
patent: WO 94/18637 (1994-08-01), None
patent: WO 97/05496 (1997-02-01), None
patent: WO 98/03879 (1998-01-01), None

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