Device and method for testing an optical element subjected to ra

Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...

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374141, 374120, 374164, G01N 1700, G01N 2500, G01N 2572

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active

057330425

ABSTRACT:
Device and method for testing an optical element (E) to determine ability to withstand heating by a high-energy luminous beam. The contact of a point (11) is applied to the optical element and is heated to a specific temperature to simulate radiation. The contact point includes a dog point having a sectional configuration similar to a track of a simulated radiation beam. The heat can be adjusted and the temperature sensed.

REFERENCES:
patent: 2769893 (1956-11-01), Muller
patent: 2951360 (1960-09-01), Sampson et al.
patent: 3222917 (1965-12-01), Roth
patent: 3258957 (1966-07-01), Smart
patent: 3378685 (1968-04-01), Green et al.
patent: 4112362 (1978-09-01), Hower et al.
patent: 4214164 (1980-07-01), Traub et al.
patent: 4620799 (1986-11-01), Palazzetti et al.
patent: 4747698 (1988-05-01), Wickramasinghe et al.
patent: 4793716 (1988-12-01), Wei et al.
patent: 4941753 (1990-07-01), Wickramasinghe
patent: 4997287 (1991-03-01), Tittl
patent: 5318361 (1994-06-01), Chase et al.
patent: 5356218 (1994-10-01), Hopson et al.
patent: 5441343 (1995-08-01), Pylkki et al.
patent: 5647667 (1997-07-01), Bast et al.
Applied Optics, vol. 23, No. 21, Nov. 1984, pp. 3774-3778, Stewart et al., "Laser Damage Test Results, Etc.".
Review of Scientific Instruments, vol. 58, No. 10, Oct. 1987, pp. 1942-1944, "Lawson Thermal Cycling Apparatus, Etc.".

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