Device and method for sensing programming status of...

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S201000, C365S189070, C365S225700

Reexamination Certificate

active

07426142

ABSTRACT:
A test circuit can test a status of a group of non-volatile elements. A current flowing to the group of non-volatile elements can be compared against a reference value. If the current is determined to be outside of a predetermined range, the non-volatile elements can be determined to be programmed. In particular embodiments, non-volatile elements can be sections of differential one-time programmable anti-fuse latch memory elements.

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