Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2008-09-16
2008-09-16
Lam, David (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S201000, C365S189070, C365S225700
Reexamination Certificate
active
11415694
ABSTRACT:
A test circuit can test a status of a group of non-volatile elements. A current flowing to the group of non-volatile elements can be compared against a reference value. If the current is determined to be outside of a predetermined range, the non-volatile elements can be determined to be programmed. In particular embodiments, non-volatile elements can be sections of differential one-time programmable anti-fuse latch memory elements.
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Cewe Tomasz
Stansell Galen E.
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