Measuring and testing – Gas analysis – Moisture content or vapor pressure
Reexamination Certificate
2006-07-28
2008-11-18
Wells, Nikita (Department: 2881)
Measuring and testing
Gas analysis
Moisture content or vapor pressure
C073S30400R, C324S658000, C324S686000, C340S620000, C600S407000
Reexamination Certificate
active
07451646
ABSTRACT:
A resonant high-speed microscopic impedance probe useful for small scale impedance measurements and/or cell and particle counting.
REFERENCES:
patent: 2656508 (1953-01-01), Coulter
patent: 4343993 (1982-08-01), Binnig
patent: 4528451 (1985-07-01), Petric
patent: 4564436 (1986-01-01), Buzzonca
patent: 4676101 (1987-06-01), Baughman
patent: 4868396 (1989-09-01), Lindsay
patent: 4924091 (1990-05-01), Hansma
patent: 4968390 (1990-11-01), Bard
patent: 4969978 (1990-11-01), Tomita
patent: 4994818 (1991-02-01), Keilmann
patent: 5202004 (1993-04-01), Kwak
patent: 5442300 (1995-08-01), Nees
patent: 5509300 (1996-04-01), Chamberlin
patent: 5519212 (1996-05-01), Elings
patent: 5581082 (1996-12-01), Hansma
patent: 5821410 (1998-10-01), Xiang
patent: 5900618 (1999-05-01), Anlage
patent: 5936237 (1999-08-01), van der Weide
patent: 6351683 (2002-02-01), Johnson et al.
patent: 6535785 (2003-03-01), Johnson et al.
patent: 2005/0043608 (2005-02-01), Haj-Yousef
T. Leinhos, O. Rudow, M. Stopka, A. Vollkopf & E. Oesterschulze, Coaxial probes for scanning near-field microscopy, Journal of Microscopy, vol. 194, Pt 2/3, May/Jun. 1999, pp. 349-352.Received Dec. 6, 1998; accepted Jan. 30, 1999.
Hansma, P.K., Drake, B., et al. (1989) “The scanning ion conductance microscope”, Science 243:641-3.
Fee, M., S. Chu, et al. (1989). “Scanning electromagnetic transmission line microscope with sub-wavelength resolution.” Optics Communications 69(3-4): 219-24.
Kwak and Bard, Anal. Chem. (1989), 61:1794-1799.
Jiang, G. Q., W. H. Wong, et al. (1993). “Measurement of the microwave dielectric constant for low-loss samples with finite thickness using open-ended coaxial-line probes.” and “Open-ended coaxial-line technique for the measurement of the microwave dielectric constant for low-loss solids and liquids.” Review of Scientific Instruments 64(6): 1614-26.
Van Der Weide, D. W. (1997). “Localized picosecond resolution with a near-field microwave/scanning-force microscope.” Applied Physics Letters 70(6): 677-79.
Van Der Weide, D. W. and P. Neuzil (1996). “The nanoscilloscope: Combined topography and AC field probing with a micromachined tip.” Journal of Vacuum Science & Technology B (Microelectronics and Nanometer Structures) 14(6): 4144-7.
Keilmann, F., D. W. van der Weide, et al. (1996). “Extreme sub-wavelength resolution with a scanning radio-frequency transmission microscope.” Optics Communications 129(1-2):15-18.
D. R. Schmidt, C. S. Yung, and A. N. Cleland, Phys. Rev. B 69, 140301 (2004).
R. J. Schoelkopf, P. Wahlgren, A. A. Kozhevnikov, P. Delsing, and D. E. Prober, Science 280, 1238 (1998).
D. R. Schmidt, C. S. Yung, and A. N. Cleland, Appl. Phys. Lett. 83, 1002 (2003).
Cleland Andrew N.
Soh Hyongsok T.
LeBlanc Stephen J.
Quine Intellectual Property Law Group
The Regents of the University of California
Wells Nikita
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