Device and method for optimizing a given parameter in a process

Optics: measuring and testing – By monitoring of webs or thread

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25055901, G01N 2184

Patent

active

056467370

ABSTRACT:
The invention aims to optimize a given parameter of a process of coating a support with a liquid composition. The device comprises: a) means (9, 10) for varying the parameter according to a predetermined profile; b) first detection means (11) for producing a first density profile for the support (6) across the width of the support, as the parameter varies; c) second detection means (13) for producing a second density profile for the support (6) parallel to the longitudinal axis, as the parameter varies; and d) means (15, 10) for determining a range of values for the said parameter for which the first and second profiles are satisfactory.

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patent: 5154951 (1992-10-01), Finnicum et al.
patent: 5243402 (1993-09-01), Weber et al
patent: 5293214 (1994-03-01), Ledger

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