Device and method for optical measurement of grains from...

Optics: measuring and testing – Shape or surface configuration

Reexamination Certificate

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Details

C250S225000, C250S339060, C250S341800, C356S625000, C356S637000

Reexamination Certificate

active

07830530

ABSTRACT:
A device for optical measuring of grains for analysis of the quality of the grains, comprises a feeder which is arranged to feed at least one grain in a direction of transport, a light source which is arranged to illuminate the grain along a line, a detector which is arranged to detect reflection from the surfaces of the grain and an analyzer which is arranged to analyze the detected reflection in order to determine a height profile of the grain along the line and to determine three-dimensional surface topographical information on the grain based on a plurality of determined height profiles as the grain is transported. The device further comprises an arrangement used in generating a two-dimensional image and the analyzer is arranged to determine a quality of the grain based on the three-dimensional surface information and the two-dimensional image of the same grain.

REFERENCES:
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patent: 5917927 (1999-06-01), Satake et al.
patent: 5956413 (1999-09-01), Oste et al.
patent: 5957773 (1999-09-01), Olmsted et al.
patent: 6369401 (2002-04-01), Lee
patent: 2005/0074146 (2005-04-01), Jones et al.
patent: 2005/0231734 (2005-10-01), Johannesson et al.
patent: 2007/0224530 (2007-09-01), Kobori et al.
patent: 2005 133905 (1993-05-01), None
patent: 2003 139443 (2002-05-01), None
patent: 2002 310919 (2002-10-01), None

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