Device and method for optical inspection

Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections

Reexamination Certificate

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Details

C356S431000, C356S239700, C356S237200

Reexamination Certificate

active

06961127

ABSTRACT:
The invention relates to a method for optical inspection with a scanner which is arranged for detection and measurement of defects in or on a material which is inspected. The inspection takes place in successive sweeps essentially in the transverse direction of the material, with each respective sweep corresponding to a plurality of pixels in said scanner. The invention is characterized in that it comprises a rolling buffer storing at least one sweep which precedes another sweep in which at least one pixel indicates triggering corresponding to a detected defect in the material. The invention also relates to a device for such inspection. By means of the invention, an improved measurement accuracy is obtained when detecting defects using the measurement system described.

REFERENCES:
patent: 4417149 (1983-11-01), Takeuchi et al.
patent: 5068799 (1991-11-01), Jarrett, Jr.
patent: 0543629 (1992-11-01), None
patent: 0696733 (1996-02-01), None
patent: 2224831 (1990-05-01), None
patent: 07190956 (1993-12-01), None
patent: 9801170-3 (1998-04-01), None
patent: 511822 (1999-11-01), None
patent: 514081 (2000-12-01), None
patent: 514090 (2000-12-01), None
patent: WO 98/21568 (1998-05-01), None
patent: WO 99/51969 (1999-10-01), None

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