Optics: measuring and testing – By monitoring of webs or thread – For flaws or imperfections
Reexamination Certificate
2005-11-01
2005-11-01
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By monitoring of webs or thread
For flaws or imperfections
C356S431000, C356S239700, C356S237200
Reexamination Certificate
active
06961127
ABSTRACT:
The invention relates to a method for optical inspection with a scanner which is arranged for detection and measurement of defects in or on a material which is inspected. The inspection takes place in successive sweeps essentially in the transverse direction of the material, with each respective sweep corresponding to a plurality of pixels in said scanner. The invention is characterized in that it comprises a rolling buffer storing at least one sweep which precedes another sweep in which at least one pixel indicates triggering corresponding to a detected defect in the material. The invention also relates to a device for such inspection. By means of the invention, an improved measurement accuracy is obtained when detecting defects using the measurement system described.
REFERENCES:
patent: 4417149 (1983-11-01), Takeuchi et al.
patent: 5068799 (1991-11-01), Jarrett, Jr.
patent: 0543629 (1992-11-01), None
patent: 0696733 (1996-02-01), None
patent: 2224831 (1990-05-01), None
patent: 07190956 (1993-12-01), None
patent: 9801170-3 (1998-04-01), None
patent: 511822 (1999-11-01), None
patent: 514081 (2000-12-01), None
patent: 514090 (2000-12-01), None
patent: WO 98/21568 (1998-05-01), None
patent: WO 99/51969 (1999-10-01), None
Lacasse Randy W.
Lacasse & Associates LLC
Punnoose Roy M.
Soundararajan Ramraj
Svante Bjork AB
LandOfFree
Device and method for optical inspection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device and method for optical inspection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for optical inspection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3497991