Device and method for milling of material using ions

Radiant energy – Irradiation of objects or material – Ion or electron beam irradiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S492200, C250S309000, C250S311000, C250S397000, C250S458100, C204S192340, C204S298360, C216S066000, C216S094000, C216S062000

Reexamination Certificate

active

07132673

ABSTRACT:
A milling device is disclosed for the preparation of microscopy specimens or other surface science applications through the use of ion bombardment. The device provides the ability to utilize both gross and fine modification of the specimen surface through the use of high and low energy ion sources. Precise control of the location of the specimen within the impingement beams created by the ion sources provides the ability to tilt and rotate the specimen with respect thereto. Locational control also permits the translocation of the specimen between the various sources under programmatic control and under consistent vacuum conditions. A load lock mechanism is also provided to permit the introduction of specimens into the device without loss of vacuum and with the ability to return the specimen to ambient temperature during such load and unload operation. The specimen may be observed and imaged during all active phases of operation.

REFERENCES:
patent: 5104684 (1992-04-01), Tao et al.
patent: 6730237 (2004-05-01), Sievers et al.
patent: 2005/0103746 (2005-05-01), Nadeau et al.
Model 1010 Ion Mill, E.A. Fischione Instruments, Inc., downloaded from www.fischione.com.
Model 1010 Ion Mill, Tabletop precision ion milling and polishing system, E.A. Fischione Instruments, Inc., Part No. 009-1302, Rev. 0.
691 Precision Ion Polishing System (PIPS™), Gatan, Inc., downloaded from www.gatan.com.
Model 691 Precision Ion Polishing System, Gatan Inc.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Device and method for milling of material using ions does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and method for milling of material using ions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for milling of material using ions will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3653328

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.