Device and method for measuring the profile of a plate

Measuring and testing – Sheet – woven fabric or fiber

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33174P, G01B 1312, G01B 1316, G01B 1322, G01B 1324

Patent

active

042200431

ABSTRACT:
A method and device for measuring a profile of a plate. The device for measuring a profile of a plate includes a plurality of aligned waveshape detectors for detecting a plurality of waveshapes and generating a plurality of waveshape signals, a waveshape processing means for determining signal variation values from the waveshape signals within small periods of time and for summing the signal variation values over a predetermined period of time and subtracting means for comparing the summed signal variation values and for generating outputs corresponding to distortion in the profile of the plate. The method for measuring a profile of a plate includes the steps of detecting the plurality of waveshapes at a plurality of positions aligned with each other in a widthwise direction of the plate, determining signal variation values in the detective waveshapes within short periods of time, summing the signal variation values over a predetermined time and comparing the summed signal variation values with one another whereby distortion of the profile of the plate is measured.

REFERENCES:
patent: 2812447 (1957-11-01), MacMartin
patent: 3340400 (1967-09-01), Quittner
patent: 3470739 (1969-10-01), Takafuji
patent: 3509751 (1970-05-01), Shiraiwa
patent: 3526114 (1970-09-01), Wistreich
patent: 3850024 (1974-11-01), Ando
patent: 3850031 (1974-11-01), Schwenzfeir
patent: 3974248 (1976-08-01), Atkinson
patent: 4031741 (1977-06-01), Schaming

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