Device and method for measuring the deformations of a sample

Details Device and method for measuring the deformations of a sample Device and method for measuring the deformations of a sample

1988-06-29

1991-05-14

Cuchlinski, Jr., William A.

Geometrical instruments

Gauge

Having a movable contact probe

33552, 33558, 33560, 33783, 335552, G01B 502, G01B 530, G01B 300

Patent

active

050144405

ABSTRACT:
A device and method are provided for measuring the deformations of a sample, with the deformations resulting more particularly from the relaxation of the stresses to which the samples were subjected prior to the measurement, and with the sample having an axis corresponding to a main deformation direction. The device comprises at least five displacement sensors each having a measurement direction, with the measurement directions being substantially perpendicular to the axis of the sample.

REFERENCES:
patent: 2496212 (1950-01-01), Holt
patent: 3010212 (1961-11-01), Kinley
patent: 3273251 (1966-09-01), Saizon
patent: 3769713 (1973-11-01), Norman
patent: 4240206 (1980-12-01), Baresh et al.
patent: 4587739 (1986-05-01), Holcomb et al.
patent: 4592149 (1986-06-01), Long

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