Device and method for measuring the deformations of a sample

Thermal measuring and testing – Distance or angle

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374 55, 374 56, 33783, 33702, 33560, 33557, 33DIG19, G01N 2500, G01B 702, G01B 2102

Patent

active

050095129

ABSTRACT:
A device and method for measuring the deformations of a sample, which deformations particularly result from the relaxation of the stresses to which the samples was previously subjected. The device and method include the use of a cell inside which the sample is placed with the cell containing a thermal mass whose heat capacity and/or thermal conductibility are appreciably greater than those of air under normal temperature and pressure conditions.

REFERENCES:
patent: 2152556 (1939-03-01), Messinger
patent: 2662401 (1953-12-01), Bailly
patent: 2689474 (1954-09-01), Wachtel
patent: 3106086 (1963-10-01), Hughel
patent: 3273251 (1966-09-01), Saizon
patent: 4069703 (1978-01-01), Standish et al.
patent: 4419314 (1983-12-01), Bush
patent: 4587739 (1986-05-01), Holcomb et al.
patent: 4644779 (1987-02-01), Sisti et al.
Khan, M. R. et al., "Thermoplastic Properties of Coal at Elevated Pressures," Fuel, vol. 63 (Jan. 1984).
Amatuni, A. N. et al., "Modernized Cryostat for the VNIIM DIN-3 Interference Dilatometer," Meas. Tech. (U.S.A.), No. 12 (Dec. 1969).
Dupont 940 Thermomechanical Analyzer, Dupont Instruments, Wilmington, Del. (Apr. 1967).

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