Device and method for measuring surface topography and wave...

Details Device and method for measuring surface topography and wave... Device and method for measuring surface topography and wave...

2006-03-13

2008-03-04

Turner, Samuel A. (Department: 2877)

Optics: measuring and testing

Plural test

C356S511000, C356S515000

Reexamination Certificate

active

07339658

ABSTRACT:
A device and a method are used for measuring the surface topography and a wave aberration of a lens system. The device is fitted with a first measuring system containing a light source radiating a first light beam of a first wavelength, and a detector which captures the first light beam which is reflected on the lens system. In addition the device has a second measuring system containing a light source for radiating a second light beam of a second wavelength and a detector for capturing the second light beam transmitted by the lens system. A diffractive optical element is disposed in a common beam path of the first measuring system and second measuring system. The optical element adapts the respective wave-front course of the first light beam and the second light beam in a wavelength-selective manner.

REFERENCES:
patent: 5673096 (1997-09-01), Dorsel et al.
patent: 5973781 (1999-10-01), Moeller et al.
patent: 7084986 (2006-08-01), Hellmuth et al.
patent: 2001/0016695 (2001-08-01), Mihashi et al.
patent: 2002/0163623 (2002-11-01), Hirohara et al.
patent: 2003/0038921 (2003-02-01), Neal et al.
patent: 2003/0169403 (2003-09-01), Curatu
patent: 197 13 138 (1998-10-01), None

Affiliated with

Also associated with

Rating

Device and method for measuring surface topography and wave... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Device and method for measuring surface topography and wave..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device and method for measuring surface topography and wave... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3979292