Optics: measuring and testing – Dimension
Reexamination Certificate
2007-03-07
2010-10-19
Stafira, Michael P (Department: 2886)
Optics: measuring and testing
Dimension
C356S635000
Reexamination Certificate
active
07817288
ABSTRACT:
A device for measuring profiles of an electron beam and a laser beam is provided with a profile measuring device30for measuring cross-section profiles of the beams in the vicinity of a collision position where an electron beam1and a laser beam3are brought into frontal collision, and a moving device40for continuously moving the profile measuring device in a predetermined direction which substantially coincides with the axial directions of the beams. Furthermore, based on the cross-section profiles measured by the profile measuring device, the position of the profile measuring device in the predetermined direction, and the oscillation timings of the beams, temporal changes in three-dimensional profiles of the electron beam and the laser beam are created by a profile creating device50.
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Dobashi Katsuhiro
Ishida Daisuke
Kaneko Namio
Nose Hiroyuki
Sakamoto Fumito
Griffin & Szipl, P.C.
IHI Corporation
National Institute of Radiological Sciences
Stafira Michael P
The University of Tokyo
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